Coupling of the Finite Integration Technique and the Uniform Theory
of Diffraction
The Finite Integration Technique
- FIT is used in combination with a ray tracing technique in order to solve
general radiation and scattering problems. The FIT is very well suited
for the analysis of complex structures containing inhomogeneous and anisotropic
materials. This method however becomes inefficient when the dimensions
of the solution domain are large comparing to the smallest wavelength of
the spectrum. Ray tracing techniques on the other hand have been successfully
used for the solution of problems where the dimensions of the objects are
large comparing to the wavelength. According to these techniques, the scattering
from the objects can be approximated by a number of reflected and diffracted
rays. Their main limitation is that for small objects the accuracy of the
solution is poor. A hybrid method which combines the FIT with a ray tracing
technique allows the treatment of a great variety of structures containing
both small and large objects. The solution domain is divided into two subdomains:
a first one which encloses the small objects and the inhomogenities of
the material (if there are some) and a second, an open one, which contains
the large scatterers. The internal problem is solved using the FIT with
application of an absorbing boundary condition. The resulting field distribution
on the boundary is then considered as an equivalent source for the external
problem, according to the Equivalence Principle. For the solution of the
external problem a ray tracing algorithm is used where diffraction effects
are taken into account by applying the UTD formulations. Examples will
be given for validation of the method.
* Scholarship from the Foundation of National
Grants "IKY" of Greece
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